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From the last workshop: @arm61: a student is using a priori information from SANS and Brewster angle for inputs to reflectivity (follow-up?)
A. Rennie: The only system commonly done is X-ray and neutron reflectivity, which often has issues with statistical weighting @andyfaff : ellipsometry is also used quite a bit. Polymer brushes, with varying thickness over the wafer, are fed in as a priori information for an incoherent addition model. @arm61 for X-rays, if doing GIXD simultaneous with reflectometry, could us results of GIXD to co-refine. @wpotrzebowski combining NMR with Bayesian statistical framework, there is a lot of activity in small-angle scattering world about combining X-ray with neutron measurements. @andyfaff: there is a desire for a general ellipsometry analysis package. There may be packages on github that have kernel.
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