Identify ways to simplify modeling data from the same sample, with different techniques (e.g. reflectometry + fluorescence)

[bmaranville]

No description provided.

[wpotrzebowski]

@wpotrzebowski: to feedback from SAS community

[bmaranville]

From the last workshop:
@arm61: a student is using a priori information from SANS and Brewster angle for inputs to reflectivity (follow-up?)
A. Rennie: The only system commonly done is X-ray and neutron reflectivity, which often has issues with statistical weighting
@andyfaff : ellipsometry is also used quite a bit. Polymer brushes, with varying thickness over the wafer, are fed in as a priori information for an incoherent addition model.
@arm61 for X-rays, if doing GIXD simultaneous with reflectometry, could us results of GIXD to co-refine.
@wpotrzebowski combining NMR with Bayesian statistical framework, there is a lot of activity in small-angle scattering world about combining X-ray with neutron measurements.
@andyfaff: there is a desire for a general ellipsometry analysis package. There may be packages on github that have kernel.

[andyfaff]

My students (@igresh, @haydenrob) and I have been working on an ellipsometry aspect of this recently.